My research centers on the structural evolution of thin films and interfaces, driven by the development and application of advanced synchrotron‑based X‑ray scattering instrumentation and techniques. I work on organic semiconductors, hybrid interfaces, and energy‑relevant materials, alongside fundamental studies of coherent X‑ray techniques to probe nanoscale ordering and dynamics in functional systems.

Keywords: Surface X‑ray scattering; Coherent X‑ray diffraction; Thin‑film growth; Synchrotron radiation; Organic semiconductors; Hybrid interfaces; Energy materials; Photoactive thin films; AFM; GI-SAXS; GI-WAXS; GIXD; Charge‑transfer interfaces; Oxide surfaces; X-ray photon correlaiton spectroscopy (XPCS).